STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...

Certain statements contained in this release may be considered forward-looking statements within the meaning of the U.S. Private Securities Litigation Reform Act of 1995, including all references to a ...

HBM4 test intensity boosts probe card replacement cycles; 2026 revenue +18.5% & margin upside. Click for more on FORM stock ...

Enhancing the capabilities of the Probilt PB6500 probe card analyzer is a 12" diameter tungsten-carbide measurement chuck with dual cameras and extended stage travel that allows probe arrays as big as ...

The Probe Card Market was USD 4.44 Bn in 2024 and is expected to expand at a CAGR of 6.9 % from 2025 to 2032, reaching USD 7.58 Bn by 2032. Probe cards are essential for guaranteeing the performance ...

The rapid development of AI and high-performance computing (HPC) chips is providing long-term demand support for the ...

Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...