Semiconductor Engineering

Improve Logic Test With A Hybrid ATPG/BIST Solution

Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...
EDN

Cell-aware ATPG test methods improve test quality

Traditional IC pattern-generation methods focus on detectingdefects at gate terminals or at interconnects. Unfortunately, a significantpopulation of defects may occur within an IC's gates, or cells.
Forbes

When A Logic Test Forgets Logic

This voice experience is generated by AI. Learn more. This voice experience is generated by AI. Learn more. About a decade ago, the college admissions world was surprised by the emergence of a new ...
Electronic Design

What’s The Difference Between ATPG And Logic BIST?

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...
Harvard Business Review

When Strategy Fails the Logic Test

I pretty much knew that the reaction to my last blog analyzing the flawed logic of the AOL-Time Warner merger would elicit comments blasting me for using 20-20 hindsight. However, being right was not ...